Mahr Metrology - XCR 20 MarWin

In Z, relative to stylus tip:
0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)

In Z, relative to measuring system:
0.04 µm

On smooth surfaces, depending on deflection:
trailing edges up to 88°, leading edges up to 77°

0.2 mm

25

0.1 to 1 mm/s

175 mm, 350 mm

200 mm

In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s

< 1 µm (over 200 mm)

0.2 mm/s to 4 mm/s

Stylus method

R probe, MFW 250
Optical probe Focodyn*, LS 1*, LS 10*
(*only in conjunction with PGK or GD 120 CNC drive unit)

(in Z) 50 mm
MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)

Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
(.022 / .070 / .224 / .700 / 2.240 in),
Measurement up to stop, variable

1 to 50 (default: 5)

1 mN to 120 mN, below and above
(can be set in MarSurf XC 20)