Your entry into precision contour measurement
- The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria
- Consistently delivers safe and reliable results
- Parameters that are dependent on datum elements are recalculated as soon as a datum element is changed
- Password protected user access prevents improper use
- Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.
- Sturdy, rigid probes
- Smooth running, sturdy and accurate drive unit
- Automatic lowering and raising of the probe arm at individually adjustable speeds
- Patented probe arm attachement for collision protection
Technical Data
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Resolution
|
In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm |
|---|---|
|
Sampling angle
|
On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
|
|
Start of traversing length (in X)
|
0.2 mm
|
|
Tip radius
|
25 µm
|
|
Contacting speed (in Z)
|
0.1 to 1 mm/s
|
|
Probe arm length
|
175 mm, 350 mm
|
|
End of traversing length (in X)
|
120 mm
|
|
Positioning speed
|
In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s |
|
Guide deviation
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< 1 µm (over 120 mm)
|
|
Measuring speed
|
0.2 mm/s to 4 mm/s
|
|
Measuring range mm
|
(in Z) 50 mm
|
|
Traversing lengths
|
0.2 mm to 120 mm
|
|
Measuring force (N)
|
1 mN to 120 mN
|
US 8515 
GB 7912 
CA 7184 
AU 6912 
IE 4940 
NZ 3516 
BR 3215 
VN 913 
