Selangor,Kuala Lumpur (KL),Subang Jaya Mahr Metrology - XCR 20 MarWin Surface Texture Measuring Instruments - Dimensional Metrology System from Obsnap Instruments Sdn Bhd

Roughness and contour measurement at a measuring station with MarSurf XCR 20
The combined measuring station allows both surface roughness and
contour measurements to be performed at a single measuring station.
Depending on the measuring task, either the GD 25 drive unit for surface roughness measurements or the PCV drive unit for contour measurements can be activated.
Both measuring systems are fixed to the measuring stand by means of a combi holder.

Space-saving design: the two drive units can be adapted by means of the corresponding combi holder to MarSurf ST 500 or ST 750 measuring stands
Roughness and contour evaluation from a single measurement
High precision contour and roughness evaluation for components requiring a long stroke and very high resolution with the MarSurf LD 130 / LD 260 measuring system
Quick changeover between roughness and contour measurement by switching within the software platform and swapping mechanical components such as the drive unit and probe

Technical Data

Resolution	In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm) In Z, relative to measuring system: 0.04 µm
Sampling angle	On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)	0.2 mm
Tip radius	25
Contacting speed (in Z)	0.1 to 1 mm/s
Probe arm length	175 mm, 350 mm
End of traversing length (in X)	200 mm
Positioning speed	In X and return speed: 0.2 to 8 mm/s In Z: 0.2 to 10 mm/s
Guide deviation	< 1 µm (over 200 mm)
Measuring speed	0.2 mm/s to 4 mm/s
Measuring principle	Stylus method
Probe	R probe, MFW 250 Optical probe Focodyn, LS 1, LS 10* (*only in conjunction with PGK or GD 120 CNC drive unit)
Measuring range mm	(in Z) 50 mm MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
Traversing lengths	Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm, (.022 / .070 / .224 / .700 / 2.240 in), Measurement up to stop, variable
Number n of sampling length according to ISO/JIS	1 to 50 (default: 5)
Measuring force (N)	1 mN to 120 mN, below and above (can be set in MarSurf XC 20)

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Selangor,Kuala Lumpur (KL),Subang Jaya - Mahr Metrology - XCR 20 MarWin

Mahr Metrology - XCR 20 MarWin