EDAX Orbis II Micro-XRF System

The EDAX^® Orbis^™ II micro-x-ray fluorescence (micro-XRF) system delivers non-destructive, high-performance elemental analysis with unmatched flexibility and ease of use. Engineered for excellence across the full spectrum of micro-XRF applications, the Orbis II empowers users to analyze everything from the smallest particles to large, complex samples—quickly and accurately. Experience the next level of micro-XRF analysis with the EDAX Orbis II—where precision meets performance.

 

Benefits

• Custom x-ray window technology enables the detection of light elements
• Proprietary coaxial light and x-ray optics precisely targets specific regions – eliminating x-ray interference from adjacent areas
• Maximizes throughput by collecting spectra 2.5x faster and spectral maps >3x faster
• Streamlines workflows with programmable autorun routines to boost productivity and ensure consistent, high-quality results

At the heart of the Orbis II is its patented orbital turret, now enhanced with a precision positioner that seamlessly aligns the x-ray optical axis with the high-magnification view of your sample. Paired with adjustable spot sizes ranging from 2 mm to 30 μm, this advanced system ensures that x-rays are always focused exactly where you need them—eliminating errors from microscope misalignment or sample height variations. Built on the proven Orbis platform, the Orbis II delivers the same trusted performance and reliability, now with even greater accuracy and control—so you can analyze with absolute confidence.

The Orbis II redefines speed and efficiency in micro-XRF analysis. Equipped with a high intensity x-ray source, improved electronics and a larger x-ray detector, it delivers over 1 million counts per second from the sample and processes more than 450,000 counts per second—enabling spectral collection at over 2.5× the speed of the previous generation.

Enhanced stage mapping and optimized motion control reduce stage movement time by a factor of 3 – 4×, allowing for faster, more efficient scanning. These advancements translate into higher-quality data in less time, so you can analyze more samples per day and keep your lab running at peak productivity.

Figure 1. The Orbis II leverages a patented orbital turret to seamlessly align the x-ray optical axis with the high-magnification view of your sample.

The Orbis II is available in two models: Plus and Super. The Orbis II Plus includes a 30 mm² x-ray detector with a patented silicon nitride window. It is capable of producing a maximum throughput of 250,000 counts per second (cps). The Orbis II Super comes standard with a 70 mm² x-ray detector and a beryllium window, with maximum throughput of 450,000 cps. The Orbis II Super also has an option that includes the silicon nitride window to suit the needs of your analysis.

To complement the system, Orbis Vision II is a next-generation software platform designed for speed, simplicity, and precision. With a streamlined interface and a modern, intuitive design, it enables users to perform imaging, elemental analysis, mapping, quantification, and report generation—all with fewer clicks and greater efficiency.

Built on rigorous user testing and real-world feedback, Orbis Vision II delivers a smarter, more responsive experience that helps you get from setup to results faster than ever before.

Figure 2. This 15 mm x 15 mm floor tile was scanned using a 50 kV tube voltage and 1,000 μA tube current. A 30 μm polycapillary optic enabled high resolution mapping at a 15 μm step size and 200 ms pixel time.

Figure 3. A graph showing the transmissions curves for the two different window options for the EDAX Orbis II. The beryllium window (red) shows higher transmission at higher x-ray energies, while the silicon nitride window (green) performs better at lower x-ray energies.