NANOS SEM-EDS
SEMPLOR high-tech company based in Eindhoven Netherlands, crucible NANOS offers SEM imaging, a comprehensive and affordable tabletop SEM for high-resolution imaging and integrated energy dispersive spectroscopy (EDS) for rapid elemental analysis. It is designed for easy installation, ease of use and easy servicing. Perfect for research & development, educational & industrial usage.
Discover EDS is a cutting-edge, fully embedded EDS Energy Dispersive X-Ray analysis software designed specifically for the NANOS scanning electron microscope. It seamlessly combines high-performance elemental analysis with an intuitive user interface, delivering fast and reliable results directly within your SEM environment. Whether you're working with routine samples or handling complex material characterization, Discover EDS simplifies your workflow without compromising precision..gif)
| EDS SPECIFICATIONS | Detector type | Silicon Drift Detector (SDD), thermo-electrically cooled |
| Detector active area | 30 mm2 | |
| Energy resolution | @ Mn Kα < 132 eV | |
| Max. input count rate | 300,000 cps | |
| Max. resolution | 2048 x 2048 | |
| Hardware integration | Fully embedded SDD, pulse processor and scan generator | |
| SOFTWARE | Installed on Windows PC and controlled via user interface | |
| EDS point analysis, line analysis and mapping | ||
| Export functions | ||
Detectors
An Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD) is installed for Elemental Analysis.
Elemental Analysis
The NANOS comes with a fully integrated Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD). Via the User Interface operator can select EDX Point Analysis or activate Elemental Mapping.
SEMPLOR was founded in 2021 by seasoned electron microscopy experts. The NANOS has been developed by passionate innovators with an extensive network and deep-understanding of EM technology and engineering. All together the team has more than 200+ years EM experience with Philips.
#FEI, #Phenom & #ThermoFisher #SEM #scanning electron microscope #electron microscope #microscopy #EDX
US 6480 
GB 5201 
AU 4772 
CA 4761 
IE 3371 
NZ 2970 
CN 1019 
BR 852 
