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🧠 Smart Metrology for Advanced Semiconductor Applications VIEW Continuous Image Capture High-Speed, High-Accuracy Measurement for Fan-Out, Shower Head, and Probe Card Inspection Precision has a new standard. In the semiconductor industry, every micron matters — and every second counts. With VIEW’s Continuous Image Capture technology, you can inspect complex, high-density components like fan-out packages, probe cards, and shower heads at full speed without sacrificing measurement accuracy. 🔧 Purpose-Built for Semiconductor Challenges 🔹 Fan-Out WLP & Redistribution Layers (RDL) Measure ultra-fine features during motion Handle warpage and large formats with precision stitching Maintain sub-micron accuracy across wide fields of view 🔹 Shower Heads Measure hundreds of micro-nozzles quickly and consistently Perfect concentricity, pitch, and alignment analysis Non-contact inspection eliminates risk of surface damage 🔹 Probe Cards High-density pin array inspection with automatic alignment Fast measurement of probe tip height, pitch, coplanarity Reliable results, even with complex geometries ⚡ Speed Meets Accuracy ✅ Continuous Scanning – No need to stop for each image ✅ High-Speed Throughput – Ideal for volume production environments ✅ Sub-Micron Precision – Powered by VIEW’s advanced optics and software ✅ Robust Measurement Algorithms – Designed for high-contrast, fine-line features ✅ Seamless Integration – For QA labs, cleanrooms, and production lines 🔍 Metrology That Moves as Fast as You Do VIEW systems with Continuous Image Capture are trusted by leading fabs, OSATs, and semiconductor equipment manufacturers worldwide — enabling reliable, repeatable measurements for today's most demanding microelectronic components. 📞 Ready to Upgrade Your Semiconductor Inspection? Experience unmatched speed and precision with VIEW. Contact us today to schedule a live demo or learn more. 🌐 www.anirestech.com.my ✉️ sales@anirestech.com | ☎️ +60124983908 Category by High-Speed Measurement on VIEW Systems