Hisomet Measuring Microscope Union XYZ High Precision Metrology Microscope with Digital Readout / PC Software, 1µm–0.1µm Resolution, Multi-Stage Travel System for Semiconductor & Industrial Measurement Applications
The system supports a wide range of stage travel configurations from 50×50mm up to 300×300mm, allowing flexibility for different sample sizes and measurement requirements. Users can operate the system via a digital readout counter or connect it directly to a PC with advanced metrology software for enhanced data analysis and reporting.
Equipped with multiple objective lens options from 3X to 100X, the Hisomet Measuring Microscope is widely used in semiconductor manufacturing processes such as wire loop height measurement, die attach height, BGA ball diameter, epoxy height analysis, and lead frame XYZ inspection, delivering reliable and repeatable results.
Key Features / Advantages
- High-precision XYZ measuring system for micro-scale dimensional inspection
- Ultra-fine resolution options from 1µm to 0.1µm for advanced accuracy
- Precise focus indicator and target mark for excellent Z-axis repeatability
- Flexible stage travel options from compact to large format (50×50mm to 300×300mm)
- Supports digital readout counter or PC-based metrology software integration
- Wide range of objective lenses from 3X to 100X for versatile magnification
- Designed for semiconductor and microelectronics inspection applications
- High stability construction for repeatable industrial-grade measurements
- Suitable for automated quality control and precision laboratory environments
Technical Specifications
| System Type | XYZ Measuring Microscope (Hisomet – Union) |
| Focus System | Precise Focus Indicator / Target Mark for High Z-Axis Repeatability |
| Resolution | 1µm / 0.5µm / 0.1µm |
| Stage Travel Options | 50×50mm, 100×50mm, 200×100mm, 250×100mm, 150×150mm, 300×300mm |
| Output System | Digital Readout Counter or PC with Metrology Software |
| Objective Lenses | 3X, 5X, 10X, 20X, 40X, 100X |
| Measurement Applications | Wire loop height, die attach height, die placement, BGA ball height, ball diameter, epoxy height, lead frame XYZ measurement |
| Application Fields | Semiconductor manufacturing, microelectronics, precision engineering, quality control, R&D laboratories |
Improve your measurement accuracy and semiconductor inspection capability with the Hisomet Measuring Microscope—contact us today for quotation, technical consultation, or system configuration tailored to your application needs.
