1 MHz to 300 MHz Measurement Frequency Impedance Analyzer with 0.5 ms Test Speed and Superior Repeatability
Hioki LCR Meters and Impedance Analyzers range from 1 mHz to 3 GHz devices to suit a wide range of applications in the testing of electronic components. The IM7580A impedance analyzer offers a top measurement time of 0.5 ms over a 1 MHz to 300 MHz frequency, and both LCR and Analyzer Modes to meet applications for both high volume production inspections and research and development.
LCR Measurement Using the SMD Test Fixture IM9201: Impedance Analyzer IM7580 series
The IM7580 series encompasses five models covering measurement frequencies of 1 MHz to 3 GHz. Used in combination with the Test Fixture IM9201, which can accommodate six SMD sizes, IM7580 series instruments allow you to measure specimens easily and reliably.
Key Features
- 1 MHz to 300 MHz testing source frequency
- Fastest test speed of 0.5 msec
- ±0.72% rdg. basic accuracy
- RF I-V method
- Half-rack size body and palm-sized test head
- Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
- Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
The instrument does not ship with a test fixture or probe. A test fixture designed specifically for use with the Impedance Analyzer is required.
Basic specifications
Accuracy guaranteed: 1 year| Measurement modes | LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode | |||||
|---|---|---|---|---|---|---|
| Measurement parameters | Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q | |||||
| Measurable range | 100 mΩ to 5 kΩ | |||||
| Display range | Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ) Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99) θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF) D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS) G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %) |
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| Basic accuracy | Z: ±0.72 % rdg. θ: ±0.41° | |||||
| Measurement frequency | 1.0000 MHz to 300.00 MHz (5 digits resolution) | |||||
| Measurement signal level | Power: -40.0 dBm to +7.0 dBm Voltage: 4 mV to 1001 mVrms Current: 0.09 mA to 20.02 mArms |
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| Output impedance | 50 Ω | |||||
| Display | 8.4-inch color TFT with touch screen | |||||
| Measurement speeds *1 | FAST: 0.5 ms (Analog measurement time, typical value) | |||||
| Functions | Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation | |||||
| Interfaces | EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional) | |||||
| Power supply | 100 to 240 V AC, 50/60 Hz, 70 VA max. | |||||
| Dimensions and mass | Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 268 mm (10.55 in) D, 6.5 kg (229.3 oz) Test head: 61 mm (2.40 in) W × 55 mm (2.17 in) H × 24 mm (0.94 in) D, 175 g (6.2 oz) |
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| Included accessories | Test head ×1, Connection cable ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1, Power cord ×1 | |||||
US 6921 
BR 2757 
AU 1509 
TH 1443 
JP 1371 
SG 1150 
CA 947 
VN 698 
