Brand: TIME
Model: TIME 1150
Product Introduction:
TIME1150 Ultrasonic Flaw Detector is a portable, industrial, non-destructive ultrasonic flaw detector, which confirms to EN12668-1 standard, and used to rapidly, and easily inspect work pieces accurately for various defects such as cracks, inclusions and pinhole porosity etc. Further evaluation of these defects can be performed during the testing process. The instrument can be used extensively in many varying fields where materials inspection is required to maintain quality control during manufacturing and production processes, e.g. manufacturing industries, iron & steel industry, metallurgical industry, metalworking, chemical industry, etc. Ultrasonic flaw detectors are also used extensively in the active safety inspection and service-life evaluation of components in such fields as aerospace, railway transportation and boiler pressure vessels, etc.
Features:
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Operating temperature |
-10℃~+50℃ |
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Storage temperature |
-20℃~+60℃ |
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Language |
English/Chinese/Spanish selectable |
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Probe socket |
LEMO or BNC |
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Battery (mAh) |
2x3.7V 5000mAh |
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Battery working time |
>8h |
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Charging time (h) |
<8h |
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Power adapter Input |
100-240~50/60Hz |
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Output |
9V DC/3A~4A |
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LCD |
Color transmission TFT, 640x480 |
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Dimension (mm) |
177X255X51 |
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Weight (g) |
1200 |
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Basic |
Receiver |
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Measuring unit |
mm/inch/μs |
Gain (dB) |
0~110 |
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Scanning range (mm) |
0-10000 |
Bandwidth (MHz) |
0.5~15 |
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Sound velocity (m/s) |
600-16000 |
Rectify |
Positive half wave, negative half wave, full and RF |
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P-delay (μs) |
-1.000~750.000 |
Vertical linearity accuracy |
±2% |
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D-delay (μs) |
-20~+3400 |
Amplifier resolution (dB) |
±1 |
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Test mode |
Pulse-echo, dual and through transmission |
Rejection (1%) |
Linear, 0~80% of the full screen |
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Scanning mode |
A scan and B scan, displaying both simultaneously |
Sampling frequency (MHz) |
80 |
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Pulse generator |
Crosstalk rejection (dB) |
≥80 |
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Pulser (V) |
Square pulse |
Dead zone (μs) |
≤10 (related with transmitting) |
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Transmitting voltage |
100~400(V) variable in steps of 10V |
Dynamic range (dB) |
≥40 |
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Transmitting pulse width (ns) |
75/100~500 variable in steps of 50ns |
Instant resolution (dB) |
≥32 |
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Damping (Ω) |
50/100/200/500 |
Time base linearity |
<±0.2% full screen |
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Pulse repetition frequency (Hz) |
10~1000 |
Sensitivity leavings (dB) |
≥62 |
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Measurements and others |
Data management, communication and print |
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Gate |
2 indepent gates |
Data storage |
50 channels |
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Testing position |
Edge, Peak value |
1000 wave images (including 980 A scan images and 20 B scan images) |
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Gate measurements |
Echo amplitude, Sound path, depth, projection etc. |
4x2000 dynamic wave image |
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Freeze |
Freeze waveform, peak value, comparative and envelope |
Store, review or replay the channels, waves |
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AVG equivalent calculate |
Calculate the flaw equivalent according to the flaw echo and AVG curve |
All the data can be stored to PC or flash disk |
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DAC flaw evaluating |
Make flaw evaluation according to flaw echo and DAC curve |
Communication |
Communicate with PC via USB interface |
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Gate logic |
Off, measurement, gate positive wave alarm, gate negative wave alarm |
Printing |
Print report |
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Gate alarm |
off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock |
Outout port |
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Alarm |
on/off |
USB OTG port |
USB 2.0 device connected with PC |
