Combines decades of experience in surface metrology with innovative technology
- Easy to read icons
-User friendly operator assistance
A sampling length of up to 120 mm is possible in conjunction with the GD 120 drive unit
- In addition to surface roughness evaluations, profile and waviness evaluations can also be performed in this way
- Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
- Tolerance monitoring and statistics for all surface parameters
- Internal program assistance for quick and easy measurements
- Comprehensive measuring records
- Automatic functions for choosing filter and traversing length in accordance with international standards
- Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Simulation mode for rapid familiarization with operating principle
- Multiple measuring station configurations for custom applications
Technical Data
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Measuring principle
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Stylus method
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Probe
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R probe, MFW 250 B
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Measuring range mm
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MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
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Filter according to ISO/JIS
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filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
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Traversing lengths
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Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*,
Measurement up to stop, variable * Traversing length dependent on drive unit |
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Number n of sampling length according to ISO/JIS
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1 to 50 (default: 5)
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Surface parameters
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Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
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US 7449 
GB 7217 
AU 6436 
CA 6329 
NZ 3368 
IE 3258 
BR 943 
CN 904 
