●Uses imported chip sensor with resolution up to 0.01μm;
●Roughness measurement range ±1500μm, meeting high-precision industrial inspection needs;
●Supports multi-dimensional analysis of profile and roughness, covering multiple parameters (e.g., Ra, Rz, etc.);
●Import/export CAD files for profile comparison;
●Automatic programming enables rapid detection and OK/NG judgment, improving efficiency;
●Three-axis Hall joystick control for flexible and convenient operation;
●Electric column system with linear guide ensures motion stability;
●Automatic contact protection reduces stylus damage;
●Climbing angle: ascent 77°, descent 87°, suitable for complex workpiece surface inspection;
●Equipped with large-angle adjustable worktable (±30° tilt) and adjustable flat-nose pliers (0~45°);
●Supports detection of minimum internal bore of 5mm;
●Uses Class 00 (accuracy error 3μm) granite base for strong vibration resistance and long-term stability;
●Software supports one-click generation of PDF/Word/Excel reports with diverse output formats;
●Modular design (e.g., carbon fiber probe arm, hard alloy stylus) for easy replacement and low maintenance cost.
Applications:
●Automotive Manufacturing
Inspects surface roughness and profile accuracy of precision components (gears, bearings) to ensure lubrication, sealing, and fatigue life of friction pairs, preventing functional failure due to surface defects;
●Aerospace
Verifies machining quality of high-precision curved surfaces, analyzes surface waviness, and ensures aerodynamic performance and structural strength of components in extreme environments;
●Precision Electronics & Semiconductor Manufacturing
Measures nano-level roughness (Rq, Rsk) and micro-profiles to ensure signal transmission stability and prevent short circuits or signal attenuation caused by surface defects.
Product Description
Technical Specifications
|
Measurement Range |
X-direction drive |
120mm |
|
Roughness range |
±1500μm |
|
|
Z1 resolution |
0.01μm |
|
|
Z-axis height (column) |
400mm |
|
|
Profile Technical Parameters |
Linearity accuracy |
±（0.7+0.12H）μm |
|
Straightness |
0.5μm/100mm |
|
|
Roughness Technical Parameters |
Linearity accuracy |
≤±5% |
|
Residual noise |
≤0.005μm |
|
|
Repeatability stability |
3% of reading value |
|
|
Cutoff wavelengths |
0.025、0.08、0.25、0.8、2.5、8mm |
|
|
Evaluation length |
λcX1、2、3、4、5 |
|
|
Resolution |
0.01μm |
|
|
Climbing Angle |
Ascent: 77° Descent: 88° |
|
|
Roughness Evaluation Parameters |
Ra、Rz、(Rmax、Ry)、Rt、Rp、Rpm、Rz(jis)、Rv、R3z、Rs m、Rsk、Rk、Rc、Rpk、Rvk、Mr1、Mr2 |
|
|
Measurement Speed |
0.05-20mm/s |
|
|
Z-axis Speed |
0.05-20mm/s |
|
