X-ray fluorescence technology to determine the thickness and composition of plating deposits with exceptional accuracy. Measurement is performed by exposing a precisely defined area of the test specimen to x-ray energy.
Large stage chamber, flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.
XRF analyzers provide non-contact coating thickness measurement for every element, and alloy, from aluminum to uranium. Our instruments are the industry standard for very thin multi-layer alloy coatings on small parts and on complex shapes.
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Elemental Analysis
Where layers of pure metals or alloys are used to enhance product features, it is important to precisely determine both coating thickness, and the elements in the sample.
