Achieve precise and reliable testing with the Test Socket 896L PBGA 31X31, designed for 896-ball Plastic Ball Grid Array (PBGA) packages with a 31x31 grid configuration. This high-performance test socket ensures excellent contact integrity and minimal signal loss, making it ideal for testing high-pin-count ICs used in demanding applications such as processors, memory devices, and communication chips. With easy integration into automated test equipment (ATE), the Test Socket 896L PBGA 31X31 delivers optimal performance, durability, and fast test setup, reducing downtime and improving test throughput.
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Key Feature: Supports 896-ball PBGA packages with 31x31 grid, providing low contact resistance and stable electrical performance for high-speed testing.
Enhance your testing efficiency and accuracy with the Test Socket 896L PBGA 31X31, engineered for high-reliability semiconductor testing.
