- Automatic substrate recognition
- Magnetic induction for ferrous substrates
- Eddy current measurement for non-ferrous substrates
- Easy-to use menu system
- Two measuring modes: Single and Continuous
- Two working modes: Direct and Group
- Memory stores 400 readings: 80 Direct and 320 Group
- User-programmable high/low alarms
- Min/Max/Average, one or two point calibration
| Specifications | Ferrous Probe (magnetic induction) | Non-Ferrous Probe (eddy current) |
|---|---|---|
| Range (max res) | 0 to 1250µm (0.1µm); 0 to 49mils (0.004mils) | 0 to 1250µm (0.1µm); 0 to 49mils (0.004mils) |
| Basic Accuracy | ±3% | ±3% |
| Min. Curvature Radius | 1.5mm (59.06mils) | 3mm (118.1mils) |
| Minimum Diameter | 7mm (275.6mils) | 5mm (196.9mils) |
| Minimum Thickness | 0.5mm (19.69mils) | 0.3mm (11.81mils) |
| Dimensions/Weight | 4.7x2.4x1.25" (120x6 x32mm)/ 6.17oz (175g) | |
MY 1525 
US 1190 
CN 243 
AU 94 
GB 74 
AP 67 
SG 57 
CA 48 
